Characterization of polycrystalline samples for archaeological purposes by X-ray diffraction kinematics and Rietveld refinement. Revista de Investigación de Física, [S. l.], v. 27, n. 1, p. 38–45, 2024. DOI: 10.15381/rif.v27i1.28010. Disponível em: https://revistasinvestigacion.unmsm.edu.pe/index.php/fisica/article/view/28010.. Acesso em: 17 jul. 2024.