Specific Absorption Rate for Mobile Phones in Peru – 2015 and possible health effects

Authors

  • Víctor M. Cruz Ornetta Universidad Nacional Mayor de San Marcos, Facultad de Ingeniería Electrónica y Eléctrica. Lima, Perú
  • Bladimir I. Guevara Minaya Universidad Nacional Mayor de San Marcos, Facultad de Ingeniería Electrónica y Eléctrica. Lima, Perú
  • Almendra S. Vásquez Cainicela Universidad Nacional Mayor de San Marcos, Facultad de Ingeniería Electrónica y Eléctrica. Lima, Perú

Keywords:

specific absorption rate, electro-magnetic waves, mobile phone

Abstract

The risk assessment of electromagnetic fields (EMF) of mobile telephony is performed in this study using basic concepts regarding the specific absorption rate (SAR), based on the results of studies on health effects managed by the International EMF project of the World Health Organization and studies on the characteristics of exposure from mobile phones conducted in Peru by the research group "Non-Ionizing Radiation UNMSM" and very prestigious institutions in other countries. The study shows that the risk of electromagnetic waves of mobile phones is not significant as they comply with the maximum permissible limits (LMP).

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Published

2015-06-15

Issue

Vol. 18 No. 1 (2015)

Section

Original papers

License

Copyright (c) 2015 Víctor M. Cruz Ornetta, Bladimir I. Guevara Minaya, Almendra S. Vásquez Cainicela

Creative Commons License

This work is licensed under a Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International License.

Creative Commons License
Electrónica - UNMSM by Facultad de Ingeniería Electrónica y Eléctrica de la Universidad Nacional Mayor de San Marcos is licensed under a Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International License.
Based on a work at http://revistasinvestigacion.unmsm.edu.pe/index.php/electron/index.

How to Cite

Specific Absorption Rate for Mobile Phones in Peru – 2015 and possible health effects. (2015). Electrónica - UNMSM, 18(1), 3-10. https://revistasinvestigacion.unmsm.edu.pe/index.php/electron/article/view/15274