Texture Quantification in Y Ba 2 Cu 3 O 7 Superconducting Films
DOI:
https://doi.org/10.15381/rif.v23i2.20293Keywords:
Epitaxy, Texture, scanning electronic microscopy, X-ray diffractionAbstract
Y Ba2Cu3O7 epitaxial superconducting film is consequence of an optimum epitaxial growth process of superconducting grains. Also, the substrate's epitaxy has a direct repercussion on the lm microstructure and its physical properties. Conventional characterization techniques such as: scanning electronic microscopy, and x ray difrraction, allowed us to obtain a quick assessment of epitaxy quality through of texture quantification of the film. We present the results of texture quantification in Y Ba2Cu3O7 superconducting films.
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Copyright (c) 2021 Juan Gonzalez, L De Los Santos, H Sánchez Cornejo, A.M Osorio, J. Albino Aguiar, A. Bustamante
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