Monitoring of argon content in materials
DOI:
https://doi.org/10.15381/rif.v16i01.8657Keywords:
Monitoring, argon, X-ray fluorescence, materials, surface.Abstract
It is reported the possibility of monitoring the presence of argon in the surface layer of materials using the fluorescent emission of characteristic K X-rays of argon by irradiation of the surface of the materials with low energy X-rays. The low energy of these characteristic X-rays, 2,97 keV, makes possible to monitor the presence of argon down a depth of some five microns.
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Copyright (c) 2013 J. A. Bravo Cabrejos, M. E. Mejía Santillán
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