Structural and morphological characterization of Fe/Ti superlattices by X-ray reflectivity and high-resolution transmission electron microscopy

Authors

  • M. Yactayo Universidad Nacional Mayor de San Marcos https://orcid.org/0000-0002-4786-0206
  • J. Ghanbaja Institut Jean Lamour, (UMR-CNRS 7198), Université de Lorraine, Nancy, France.
  • O. Copie Institut Jean Lamour, (UMR-CNRS 7198), Université de Lorraine, Nancy, France.
  • J. Quispe-Marcatoma Facultad de Ciencias Físicas, Universidad Nacional Mayor de San Marcos, P.O.-Box 14–0149, Lima 14, Peru. https://orcid.org/0000-0001-5832-1403
  • C. V. Landauro Facultad de Ciencias Físicas, Universidad Nacional Mayor de San Marcos, P.O.-Box 14–0149, Lima 14, Peru. https://orcid.org/0000-0002-1361-7355
  • J. C. Rojas-Sánchez Institut Jean Lamour, (UMR-CNRS 7198), Université de Lorraine, Nancy, France.

DOI:

https://doi.org/10.15381/rif.v27i2.27171

Keywords:

thin film, nanostructure, structural characterization, morphological characterization, materials science

Abstract

Multilayers and superlattices consist of stacked thin films made of different materials, including magnetic and non-magnetic ones. These structures are used to produce electronic and spintronic sensors. Thin films are primarily grown using the sputtering technique. This study presents a superlattice with six stacks or periods (N=6) in the nanostructure: Glass/Ti(4.1 nm)/[Fe(2.3 nm)/Ti(1.8 nm)/Fe(2.3 nm)/Ti(4.1 nm)][6] grown by magnetron sputtering. The thickness and roughness of the sample were determined using low-angle X-ray reflectivity (XRR). In addition, a lamella was prepared using focused ion beam (FIB) for morphological analysis by high-resolution transmission electron microscopy (HRTEM). The values obtained from X-ray reflectivity were consistent with those obtained from HRTEM, allowing the growth process optimization of Fe/Ti thin films for the development of new kind of magnetic devices.

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Published

2024-08-24

Issue

Vol. 27 No. 2 (2024)

Section

Article

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Copyright (c) 2024 M. Yactayo, J. Ghanbaja, O. Copie, J. Quispe-Marcatoma, C. V. Landauro, J. C. Rojas-Sánchez

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How to Cite

Structural and morphological characterization of Fe/Ti superlattices by X-ray reflectivity and high-resolution transmission electron microscopy. (2024). Revista De Investigación De Física, 27(2), 57-61. https://doi.org/10.15381/rif.v27i2.27171