Structural and morphological characterization of Fe/Ti superlattices by X-ray reflectivity and high-resolution transmission electron microscopy
DOI:
https://doi.org/10.15381/rif.v27i2.27171Keywords:
thin film, nanostructure, structural characterization, morphological characterization, materials scienceAbstract
Multilayers and superlattices consist of stacked thin films made of different materials, including magnetic and non-magnetic ones. These structures are used to produce electronic and spintronic sensors. Thin films are primarily grown using the sputtering technique. This study presents a superlattice with six stacks or periods (N=6) in the nanostructure: Glass/Ti(4.1 nm)/[Fe(2.3 nm)/Ti(1.8 nm)/Fe(2.3 nm)/Ti(4.1 nm)][6] grown by magnetron sputtering. The thickness and roughness of the sample were determined using low-angle X-ray reflectivity (XRR). In addition, a lamella was prepared using focused ion beam (FIB) for morphological analysis by high-resolution transmission electron microscopy (HRTEM). The values obtained from X-ray reflectivity were consistent with those obtained from HRTEM, allowing the growth process optimization of Fe/Ti thin films for the development of new kind of magnetic devices.
Downloads
Published
Issue
Section
License
Copyright (c) 2024 M. Yactayo, J. Ghanbaja, O. Copie, J. Quispe-Marcatoma, C. V. Landauro, J. C. Rojas-Sánchez
![Creative Commons License](http://i.creativecommons.org/l/by/4.0/88x31.png)
This work is licensed under a Creative Commons Attribution 4.0 International License.
THE AUTHORS RETAIN THEIR RIGHTS:
a. The authors retain their trademark and patent rights, as well as any process or procedure described in the article.
b. The authors retain the right to share, copy, distribute, perform and publicly communicate the article published in the Revista de Investigación de Física (for example, place it in an institutional repository or publish it in a book), with an acknowledgment of its initial publication in the Revista de Investigación de Física.
c. The authors retain the right to make a subsequent publication of their work, to use the article or any part of it (for example: a compilation of their works, notes for conferences, thesis, or for a book), provided that they indicate the source. of publication (authors of the work, journal, volume, number and date).