Surface profilometry by defocalized fringes

Authors

DOI:

https://doi.org/10.15381/rif.v28i1.30156

Keywords:

Phase unwrapping, fringe projection profilometry, defocusing fringes, fast Fourier transform

Abstract

 In the last years, the advent of computational power for calculations purposes have a great impact in the optimization of automatic industrial process relating to computer vision, machine learning, robotics and autonomous machine decisions. In this context, the fast topographic analysis of 3D objects ranging from milimeters to decimeters plays an import rol in autonomous industrial process. From the Optics, the fringe projection profilometry has been a cheap and versatile tool for this purpose. In this work, we realize an reverse engineering of these techniques found in the literature in the last decades. We build an adquisition system and developed some Python code for the image reconstruction for objects no found in the literature.

Author Biography

  • P. H. Rivera, Universidad Nacional Mayor de San Marcos

    Doctor en Ciencias con mención en Física por la Universidad Estadual de Campinas. Investigador en fenómenos de transporte cuántico en manoestructuras semiconductoras y aplicaciones en procesamiento en paralelo. Profesor Asociado del Departamento de Física del Estado Solido en la UNMSM. Es autor de varios artículos sobre manoestructuras semiconductoras.

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Published

2025-04-17

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Section

Article

How to Cite

Surface profilometry by defocalized fringes. (2025). Revista De Investigación De Física, 28(1), 46-53. https://doi.org/10.15381/rif.v28i1.30156