Optical interferometry for piezoelectric translation measurements
DOI:
https://doi.org/10.15381/rif.v14i01.8727Keywords:
Michelson interferometry, piezoelectricity, forced oscillator.Abstract
In this work we used a simple Michelson interferometer to characterize the deformation of a piezoelectric material in function of voltage and frequency. We obtained the piezoelectric quality factors parameters, such as, the resonance frequency, the damping constant and the quality factor by simulating its behaviour like a driven oscillator.
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Copyright (c) 2011 Albert Reyna Ocas, Ilich Contreras Verástegui, Whualkuer Lozano Bartra
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